Harshit Kothari

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We compare the intrinsic reliability of the dielectric stack of a high performance bulk planar 20nm replacement gate technology to the reliability of high performance bulk planar 28 nm gate first(More)
  • Bernice Thomas, ManojChandak, Adityavardhan Patidar, Bharat Deosarkar, Harshit Kothari
  • 2014
Dental traumatic injuries may lead to several clinical complications. One of them is the pulp canal obliteration, which presents itself as an uncontrolled hard tissue deposition along the pulp(More)