Harm C. M. Bossers

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We present an online outlier detection method that is applicable to Final Test. Test limits are constructed based on previous measurements and robust statistics are used to ensure a stable start to the method. We analyze our method using realworld data. Furthermore, we identified some cases which can result in performance degradation, but most experiments(More)
In parametric IC testing, outlier detection is applied to filter out potential unreliable devices. Most outlier detection methods are used in an offline setting and hence are not applicable to Final Test, where immediate pass/fail decisions are required. Therefore, we developed a new bivariate online outlier detection method that is applicable to Final Test(More)
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