Haralampos-G. D. Stratigopoulos

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Haralampos-G. D. Stratigopoulos*, Petros ~ r i n e a s t , Mustapha slamanit and Yiorgos ~ a k r i s s *TIMA Laboratory, 46 Av. Fklix Viallet, 38031 Grenoble, France t ~ e ~ a r t r n e n t of Computer Science, Rensselaer Polytechnic Institute, Lally Hall, 110 8th Street, NY 12180, USA ~ I B M , Wireless Test Development Group, 1000 River Street 863G. Essex(More)
We present a method that is capable of handling process variations to evaluate analog/RF test measurements at the design stage. The method can readily be used to estimate test metrics, such as parametric test escape and yield loss, with parts per million accuracy, and to fix test limits that satisfy specific tradeoffs between test metrics of interest.(More)
We propose a post-fabrication calibration technique for RF circuits that is performed during production testing with minimum extra cost. Calibration is enabled by equipping the circuit with tuning knobs and sensors. Optimal tuning knob identification is achieved in one-shot based on a single test step that involves measuring the sensor outputs once. For(More)
Machine-learning-based test methods for analog/RF devices have been the subject of intense investigation over the last decade. However, despite the significant cost benefits that these methods promise, they have seen a limited success in replacing the traditional specification testing, mainly due to the incurred test error which, albeit small, cannot meet(More)
A neural classifier that learns to separate the nominal from the faulty instances of a circuit in a measurement space is developed. Experimental evidence, which demonstrates that the required separation boundaries are, in general, nonlinear, is presented. Unlike previous solutions that build hyperplanes, the proposed classifier is capable of drawing(More)
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of(More)