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Reconfigurable many-core processors have many advantages over conventionally designed devices, such as low power consumption and very high flexibility. For an increasing number of safety-critical applications, these processors must have an ultra high dependability. This paper discusses the design and verification of an infrastructural IP, the Dependability(More)
A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation(More)
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Abstract—One of the commonly used multivariate metrics for classifying defective devices from non-defective ones is Mahalanobis distance. This metric faces two major application problems: the absence(More)