Hamed Zandevakili

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Technology scales strongly increased the sensitivity of new integrated logic circuits to transient faults. Since the reliability of combinational circuit is an important factor in digital circuits design, so, a fast method to obtain accurate value of reliability becomes a main challenge. The main source of inaccuracy and scalability problems in existing(More)
Technology scale leads to increasing the vulnerability of new integrated logic circuits. The highenergy neutrons (present in terrestrial cosmic radiation) and alpha particles (that originate from impurities in the packagingmaterials) play important role in occurrence of transient faults which are e®ective factor for designing reliable integrated circuits.(More)
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