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Quantitative Raman spectrum and reliable thickness identification for atomic layers on insulating substrates.
- Song-Lin Li, H. Miyazaki, Haisheng Song, H. Kuramochi, S. Nakaharai, K. Tsukagoshi
- Physics, ChemistryACS nano
- 2 August 2012
Surprisingly, it is found that even freely suspended chalcogenide few-layer flakes have a stronger Raman response than that from the bulk phase, and this quantity can be used to rapidly determine the accurate thickness for atomic layers.
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