H Sebastian von Harrach
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A new aberration-corrected scanning transmission electron microscope equipped with an array of Si-drift energy-dispersive X-ray spectrometers has been utilized to acquire spectral image data at… Continue Reading
The quality of X-ray spectra from FEGTEMs has been improved by three different means: the use of beryllium shields, improved collimation and improved specimen holder geometry. The improvements lead… Continue Reading