H. John Mamin

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Signal processing for magnetic resonance force microscopy by<lb>Michael Y. J. Ting Chair: Alfred O. Hero III Magnetic resonance force microscopy (MRFM) is an emergent technology that has<lb>the potential for three-dimensional, non-destructive, and in-situ imaging of biological<lb>molecules with atomic resolution. Experiments at IBM have shown that MRFM(More)
We describe the design, fabrication and testing of mass-loaded cantilevers for electron-spin magnetic resonance force microscopy. These single-crystal silicon cantilevers are designed to have large gaps in their thermal mode spectra so as to reduce thermal noise near the electron-spin Rabi frequency. Each cantilever typically consists of a 2 /spl mu/m thick(More)
This paper explores strategies for fabricating and maintaining a sharp atomic force microscope (AFM) tip suitable for AFM data storage applications. To this end, AFM cantilevers have been incorporated into micromachined sled carriers and air-bearing sliders. These supports act to limit the maximum loading force on the AFM tip and allow for improved(More)
Citation Oosterkamp, T. H. et al. " Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy. Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. The MIT Faculty has made this article openly available.(More)
Cracks patterned lithographically into the buried oxide (BOX) layer of silicon-on-insulator wafers were found to substantially improve yield in the release of ultrasoft silicon cantilevers. The BOX layer is useful as an etch stop and sacrificial layer in microfabrication. However, compressive stress in the BOX membrane can cause it to buckle and crack when(More)
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