Learn More
A built-in I/sub DDQ/ monitor for CMOS digital circuits with low power supply voltage perturbation is presented. It minimizes the extra delay of the CUT in normal operation. An automatic recovery mechanism limits the drop in VDD voltage during the testing phase so the data storage is not perturbed. The I/sub DDQ/ current level may be measured by a standard(More)
With increasing integration levels, more and more ICs and systems-on-chip turn into mixed-signal designs. Typical examples are telecom (Bluetooth, WLAN, xDSL…) and multimedia (digital video, MP3 audio…) systems. This hot topic session will explore the challenges that designers face with these mixed-signal designs, covering both technical and methodological(More)
  • H. Casier
  • 2004
Summary form only given. The automotive environment poses many difficult challenges for the use of semiconductors in a car. Several challenges are common for the whole semiconductor industry, but many are very specific for automotive applications. Specific automotive requirements are e.g. high reliability, very high safety, high voltage, high temperature,(More)
  • 1