Guebum Han

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We propose a method of producing a tungsten probe with high stiffness for atomic force microscopy (AFM) in order to acquire enhanced phase contrast images and efficiently perform lithography. A tungsten probe with a tip radius between 20nm and 50nm was fabricated using electrochemical etching optimized by applying pulse waves at different voltages. The(More)
A novel, nanoscale, thickness-controlled, elastic graphene oxide-polydiallyldimethylammonium chloride (GO-PDDA) film using a layer-by-layer technique on silver nanowires and a flexible substrate is reported. Micro- and nanoscale wear and flexibility depending on the thickness and/or elastic nature of the overcoating layer demonstrate high mechanical(More)
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