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1. Abstract This paper presents the major features and capabilities of the new Standard Test Interface Language (STIL). A synopsis of the language, typical applications of the language, work that has been done to date, and degree of acceptance by the industry are discussed. The purpose of STIL is to provide a common language for the representation of test(More)
Logic built-in self test (BIST) is increasingly being adopted to improve test quality and reduce test costs for rapidly growing designs. Compared to deterministic automated test pattern gener¿ation (ATPG), BIST presents inherent fault diagnostic challenges. Previous diagnostic techniques have been limited in their diagnosis resolution and/or require(More)