Gregory A. Maston

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Logic built-in self test (BIST) is increasingly being adopted to improve test quality and reduce test costs for rapidly growing designs. Compared to deterministic automated test pattern gener¿ation (ATPG), BIST presents inherent fault diagnostic challenges. Previous diagnostic techniques have been limited in their diagnosis resolution and/or require(More)
The purpose of STIL is to provide a common language for the representation of test patterns and waveforms that are created from the simulation of a digital integrated circuit. The language represents the data in terms of intent (i.e., the waveform that is to be created at the device under test), rather than in terms of a specific piece of ATE hardware. The(More)