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Journals and Conferences
This paper addresses the problem of separating out the failure distribution of each kind of failure observed in accelerated temperature-cycle aging of one assembly lot of a 16-lead molded DIP… (More)
Electrostatic discharge (ESD) can easily damage bipolar integrated circuits. "Second breakdown" of NPN transistor emitter-base Junctions is a common failure mode. No external emitter connection is… (More)