Gopalakrishnan Juttu

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The synthesis, characterization, and growth of Ge-silicalite-1 from optically clear solutions are reported. Ge-silicalite-1 is readily formed from optically clear solutions of TEOS, TPAOH, water, and a germanium source at 368 K. X-ray fluorescence (XRF) is used to determine the Si/Ge ratio and indicates that germanium inclusion is typically 30-50% of that(More)
The synthesis, characterization, and growth rates of aluminum- and germanium,aluminum-substituted silicalite-1 (Al-silicalite-1, Ge,Al-silicalite-1) materials grown from clear solutions are reported. In the case of aluminum substitution, the crystallinity of the materials as determined by powder X-ray diffraction (PXRD) decreases with increasing aluminum(More)
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