Author pages are created from data sourced from our academic publisher partnerships and public sources.
- Publications
- Influence
RT-Level ITC'99 Benchmarks and First ATPG Results
- Fulvio Corno, M. Reorda, Giovanni Squillero
- Computer Science
- IEEE Des. Test Comput.
- 1 July 2000
TLDR
Automatic test program generation: a case study
- Fulvio Corno, E. Sánchez, M. Reorda, Giovanni Squillero
- Computer Science
- IEEE Design & Test of Computers
- 1 March 2004
TLDR
Fully automatic test program generation for microprocessor cores
- Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero
- Computer Science
- Design, Automation and Test in Europe Conference…
- 3 March 2003
TLDR
Efficient Techniques for Automatic Verification-Oriented Test Set Optimization
- E. Sánchez, M. Reorda, Giovanni Squillero
- Computer Science
- International Journal of Parallel Programming
- 1 February 2006
TLDR
Low power BIST via non-linear hybrid cellular automata
- Fulvio Corno, M. Rebaudengo, M. Reorda, Giovanni Squillero, M. Violante
- Engineering, Computer Science
- Proceedings 18th IEEE VLSI Test Symposium
- 30 April 2000
TLDR
MicroGP—An Evolutionary Assembly Program Generator
- Giovanni Squillero
- Computer Science
- Genetic Programming and Evolvable Machines
- 1 September 2005
TLDR
An RT-level fault model with high gate level correlation
- Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero
- Computer Science
- Proceedings IEEE International High-Level Design…
- 8 November 2000
TLDR
Automatic test program generation for pipelined processors
- Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero
- Computer Science
- SAC '03
- 9 March 2003
TLDR
High-level observability for effective high-level ATPG
- Fulvio Corno, M. Reorda, Giovanni Squillero
- Mathematics, Computer Science
- Proceedings 18th IEEE VLSI Test Symposium
- 30 April 2000
TLDR
A real-time evolutionary algorithm for Web prediction
- D. Bonino, Fulvio Corno, Giovanni Squillero
- Computer Science
- Proceedings IEEE/WIC International Conference on…
- 13 October 2003
TLDR