Gian Luigi Madonna

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—This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the device-under-test input reflection coefficients. A traditional vector network analyzer is(More)
Porto, the institutional repository of the Politecnico di Torino, is provided by the University Library and the IT-Services. The aim is to enable open access to all the world. Please share with us how this access benefits you. Your story matters. Abstract—A new design approach for low-cost multiprobe re-flectometers is presented. While traditional circuits(More)
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