Ghenadie Bodean

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This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
Encoder and decoder algorithm of the matroid burst errors correcting code is defined. Constant multiplications is considered, and are shown the circuits implemented in the XOR-basis that drastically reduces the encoder/decoder complexity. The features of the matroid code encoding/decoding are analysed. I. INTRODUCTION It is known [1] that the upper bound of(More)
In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small(More)
—Scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional(More)
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