Gerald E. Jellison

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A series of semiconducting zinc sulfide (ZnS) nanoparticles were scalably, reproducibly, controllably and economically synthesized with anaerobic metal-reducing Thermoanaerobacter species. These bacteria reduced partially oxidized sulfur sources to sulfides that extracellularly and thermodynamically incorporated with zinc ions to produce sparingly soluble(More)
A two-modulator generalized ellipsometer is described that is capable of measuring all 16 elements of a sample Mueller matrix with four measurements made at different azimuthal orientations of the polarization state generator and polarization state detector. If the sample can be described with a Mueller-Jones matrix, only a single measurement is needed.(More)
Fabricating complex transition metal oxides with a tunable bandgap without compromising their intriguing physical properties is a longstanding challenge. Here we examine the layered ferroelectric bismuth titanate and demonstrate that, by site-specific substitution with the Mott insulator lanthanum cobaltite, its bandgap can be narrowed by as much as 1 eV,(More)
We have optimized plasma-enhanced chemical vapor deposition (PECVD) of SiN-based antireflection (AR) coatings with special consideration for the short-wavelength (<600 nm) parasitic absorption in SiN. Spectroscopic ellipsometry was used to measure the dispersion relation for both the refractive index n and the extinction coefficient k, allowing a precise(More)
Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO3, and 6H-SiC single-crystals are examined and the(More)
The effect of windows or lenses placed between the polarization-state generator and the polarization-state detector in a general ellipsometry measurement is examined. It is found that three parameters are required for describing the effects of the window retardation on the ellipsometry measurements. Two of these window parameters can be measured at the same(More)
Two-channel spectroscopic polarization-modulation ellipsometry measurements have been made on four different glasses (fused SiO(2), finely annealed BK-7, a lead-indium-phosphate glass, and a germanium-arsenic-selenium glass). We show that this technique is sensitive to thin surface layers and that these surface layers can be modeled by using the Bruggeman(More)
We describe the formation and properties of atomically bonded, optical quality, nanostructured thin glass film coatings on glass plates, utilizing phase separation by spinodal decomposition in a sodium borosilicate glass system. Following deposition via magnetron sputtering, thermal processing and differential etching, these coatings are structurally(More)