George M. Belansek

Learn More
This paper presents an overview of the macro design, architecture, and built-in self-test (BIST) implementation as part of the IBM third-generation embedded dynamic random-access memory (DRAM) for the IBM Blue Logic ® 0.11-␮m application-specific integrated circuit (ASIC) design system (CU-11). Issues associated with embedding DRAM in an ASIC design are(More)
  • 1