George M. Belansek

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This paper presents an overview of the macro design, architecture, and built-in self-test (BIST) implementation as part of the IBM thirdgeneration embedded dynamic random-access memory (DRAM) for the IBM Blue Logic 0.11m application-specific integrated circuit (ASIC) design system (CU-11). Issues associated with embedding DRAM in an ASIC design are(More)
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