Geng Zheng

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An automated top-down design flow to achieve physical design of Analog/Mixed-Signal Systems-on-Chip (AMS-SoCs) is difficult, especially for nano-CMOS. Process variation effects have profound impact on the performance of silicon versus layout design. In this paper metamodels, (surrogate models) and Particle Swarm Optimization (PSO) have been combined in an(More)
The drive for ultra efficient and low-cost portable devices continues to push the need for low power circuit designs. The increasing transistor density and complexity of IC designs aggravates the task of producing efficient low power and low cost design. The short time to market (TTM) also increases this burden on designers, as optimal designs have to be(More)
The optimized OP-AMPs resulting out of a traditional flows, although may meet the given specifications after consuming significant design cycle time, do not guarantee an optimal system performance. In this paper, a three-step polynomial metamodel-assisted OP-AMP optimization flow is proposed to address these issues. The flow incorporate polynomial(More)
With the rapid developments in computer, communication and control technologies, the networked control systems (NCSs) have been a growing trend in industrial automation systems for the purposes of distributed management and control. This paper addresses the security issues of data transmitted in NCSs under deception attacks, especially confidentiality,(More)
Based on the strong tracking filter (STF), a STF-LQR control approach is presented for the control of a ball and beam system (BBS). The simple linearized mathematical model of the BBS is first obtained according to physics laws. In order to model the BBS accurately, an additional control action is introduced as an augmented state variable to compensate for(More)
Current Verilog-AMS system level modeling does not capture the physical design (layout) information of the target design as it is meant to be fast behavioral simulation only. Thus, the results of behavioral simulation can be very inaccurate. In this paper a <b>paradigm shift of the current trend</b> is presented that integrates layout level information(More)