Gökçe Keskin

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Transistor sizing to control random mismatch is investigated. Input offset voltage of 65nm bulk CMOS SRAM sense amplifiers are measured to analyze NMOS and PMOS threshold voltage (Vtn, Vtp) variation effects and compare them with statistical models and Pelgrom model predictions. A linear statistical response surface model (RSM) relating input offset to Vtn(More)
The aim of this study was to investigate the reliability of medial plantar (MP) and lateral plantar (LP) nerve conduction studies (NCS) in healthy individuals aged >65 years, and to obtain reference values for this age group. The study included 81 healthy subjects. MP response was absent in only 2 subjects, but LP response could not be obtained bilaterally(More)
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we describe a novel technique of adaptive post-silicon tuning to reliably design MEMS filters that are robust to process variations. Our key idea is to implement a number of redundant(More)
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