Gökçe Keskin

Learn More
Transistor sizing to control random mismatch is investigated. Input offset voltage of 65nm bulk CMOS SRAM sense amplifiers are measured to analyze NMOS and PMOS threshold voltage (Vtn, Vtp) variation effects and compare them with statistical models and Pelgrom model predictions. A linear statistical response surface model (RSM) relating input offset to Vtn(More)
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we describe a novel technique of adaptive post-silicon tuning to reliably design MEMS filters that are robust to process variations. Our key idea is to implement a number of redundant(More)
  • 1