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—Built-In Self-Test (BIST) techniques constitute an effective and practical approach for VLSI circuits testing. BIST schemes are typically classified into two categories: offline and online. Input vector monitoring concurrent BIST schemes are a class of online techniques that circumvent the problems appearing separately in online and in offline BIST in a… (More)
In a 0-1 sequence of Markov dependent trials we consider a statistic which counts strings of a limited length run of 0s between subsequent 1s. Its probability mass function is used to determine the chance that a stochastic process remains or not in statistical control. Illustrative numerics are presented.
The expected number of 0-1 strings of a limited length is a potentially useful index of the behavior of stochastic processes describing the occurrence of critical events (e.g., records, extremes, and exceedances). Such model sequences might be derived by a Hoppe-Polya or a Polya-Eggenberger urn model interpreting the drawings of white balls as occurrences… (More)
—A consecutive system, the failure of which depends on the occurrence of a number of failure-success patterns, is introduced. It extends several consecutive systems studied so far in the literature. The exact system reliability is determined for systems with independently functioning components. The derivations are based on the exact distribution of… (More)