Learn More
—Built-In Self-Test (BIST) techniques constitute an effective and practical approach for VLSI circuits testing. BIST schemes are typically classified into two categories: offline and online. Input vector monitoring concurrent BIST schemes are a class of online techniques that circumvent the problems appearing separately in online and in offline BIST in a(More)
The expected number of 0-1 strings of a limited length is a potentially useful index of the behavior of stochastic processes describing the occurrence of critical events (e.g., records, extremes, and exceedances). Such model sequences might be derived by a Hoppe-Polya or a Polya-Eggenberger urn model interpreting the drawings of white balls as occurrences(More)
  • 1