Frank C. Hsu

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This paper reviews the structured design concept and conventional diagnostic methods. It presents an alternate approach, called structured-trace method, for diagnosing failures on high level packages, which are structurally designed, such as LSSD structure. Implications of structured designs on failure diagnosis are discussed. Results from an evaluation(More)
This paper proposes a testing and diagnostic method that reduces fault location and repair costs on printed circuit boards populated with LSI and VLSI modules. The method requires some additional circuitry on the module subassembly. It enhances the following test strategies: automatic probing, bed-of-nails, Subassembly-in-Place, and Level Sensitive to Scan(More)
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