Frank Bouwman

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Decreasing feature sizes and increasing customer demand for more functionality have forced design teams to re-use design blocks and application platforms. As a result, re-use of test, design-for-test and design-for-debug for large system chips is becoming increasingly important and increasingly necessary. In this paper, the test and debug features of the(More)
| For today's multi-million transistor designs , existing design veriication techniques cannot guarantee that rst silicon is designed error free. Therefore, techniques are necessary to ee-ciently debug rst-silicon. In this article we show how scan-based debug can be used in a multiple clock domain system-on-a-chip. Both the necessary hardware measures,(More)
This report describes the development of a language based on VHDL intended to simplify the use of IDDQ instrumentation in production testing. This language called 'Monitor Description Fonnat' or MDF, is part of the development by QTAG (Quality Test Action Group) of an infrastructure for quiescent current testing. The MDF can be used with commercial(More)
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