Frank Bouwman

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Decreasing feature sizes and increasing customer demand for more functionality have forced design teams to re-use design blocks and application platforms. As a result, re-use of test, design-for-test and design-for-debug for large system chips is becoming increasingly important and increasingly necessary. In this paper, the test and debug features of the(More)
| For today's multi-million transistor designs , existing design veriication techniques cannot guarantee that rst silicon is designed error free. Therefore, techniques are necessary to ee-ciently debug rst-silicon. In this article we show how scan-based debug can be used in a multiple clock domain system-on-a-chip. Both the necessary hardware measures,(More)
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