Francis Lilley

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What we believe to be a novel three-dimensional (3D) phase unwrapping algorithm is proposed to unwrap 3D wrapped-phase volumes. It depends on a quality map to unwrap the most reliable voxels first and the least reliable voxels last. The technique follows a discrete unwrapping path to perform the unwrapping process. The performance of this technique was(More)
This paper describes the design and construction of an open, automated, solder bond veriication machine for the electronics manufacturing industry. The application domain is the higher end assembly technologies, with an emphasis on ne pitch surface mount c o m p o n e n ts. The system serves a measurement function, quantifying the solder bonds. It(More)
PURPOSE The CT body surface underpins millimeter scale dose computation in radical radiotherapy. A lack of technology has prevented measurement of surface topology changes during irradiation. Consequently, body changes are incorporated into plans statistically. We describe the technology for dynamic measurement of continuous surface topology at(More)
Robust three­dimensional best­path phase­unwrapping algorithm that avoids singularity loops. Users may access full items free of charge; copies of full text items generally can be reproduced, displayed or performed and given to third parties in any format or medium for personal research or study, educational or not­for­profit purposes without prior(More)
Breast cancer patients are commonly treated after surgery using radiotherapy with the breast unconstrained, which leaves the technique susceptible to respiratory motion, deformations of the breast tissues and the ability to sustain setup posture. Continuously structured light projection from an interferometer system is used to generate a temporal sequence(More)
(2008) Fringe pattern analysis using a one-dimensional modified Morlet continuous wavelet transform. Users may access full items free of charge; copies of full text items generally can be reproduced, displayed or performed and given to third parties in any format or medium for personal research or study, educational or not-for-profit purposes without prior(More)
The Atomic Force Microscope using contact mode forms the image by contacting the sample surface with a sharp tip that is attached to the free end of a cantilever. While the sample is scanned horizontally the cantilever deflects. The deflection of the cantilever can be sensed among several methods. For instance, optical beam deflection where this method is(More)
— The Atomic Force Microscope (AFM) is a very important instrument for use in nanotechnology and biology since it can be used to measure a wide variety of objects, such as nano-particles and cells, either in air or liquid. However, the images that are measured using AFM are distorted because of the influence of the tip geometry and the dynamic response of(More)
—All atomic force microscope (AFM) images suffer from distortions, which are principally produced by the interaction between the measured sample and the AFM tip. The atomic force microscope (AFM) is a very important instrument for use in nanotechnology and biology since it can be used to measure a wide variety of objects, such as nano-particles and cells,(More)