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In this paper, we propose a technique for the detection of neutrons that relies on the sensitivity of SRAM cells to particle radiation. In particular, we introduce a system based on a memory test bench that records the neutron reactions in the memory array. This system allows a good flexibility from different points of view. It is conceived to be modular,(More)
Due to cosmic rays, electronic devices such as SRAM may undergo some dysfunctions such as single event upsets also called Soft errors. A crucial issue for aerospace applications is to be able to predict the Soft Error rate of a given device in a given environment. In this work, we present a predictive tool which deals with protons and heavy ions for space(More)
In the early 1990s, active power devices have been shown to be susceptible to radiation-induced failures. Many studies have been focused on cosmic ray-induced power device failures, including even IGBT failures. Till the end of the 1990s, IGBT technologies were susceptible to static or dynamic latch-up, which are respectively occurring in their forward(More)