Flavio Galliana

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In the framework of the preparation of the National Institute of Metrological Research (INRIM) to its participation at the “Supplementary Comparison EURAMET.EM-S32 Comparison of Resistance Standards at 1 TΩ and 100 TΩ,” an evaluation of two measurement techniques for high resistance measurements at INRIM has been made. The first method, working between 10(More)
In the framework of the revision and optimization of the measurement techniques for high-resistance measurements at the National Institute of Metrological Research (INRIM), a 100 MΩ-step Hamon-guarded network was projected and built. With this transfer standard, the 2σ uncertainty of the maintained 1 GΩ standard at INRIM is now on the order of 7.0 × 10−6 at(More)
The capacitance-charging method is a well-established and handy technique for the generation of dc current in the 100 pA range or lower. The method involves a capacitance standard and a sampling voltmeter, highly stable devices easy to calibrate, and it is robust and insensitive to the voltage burden of the instrument being calibrated. We propose here a(More)
Ameasurement technique to calibrate current clamp meters in ac current in the measurement range from 100 to 1500 A at 50 Hz has been developed at the National Institute of Metrological Research (INRIM) in addition to the primary reference measurement systems for ac current calibrations at INRIM. This technique is traceable to the national standards of dc(More)
A temperature controlled 1 Ω and 10 kΩ standard resistors setup has been developed at National Institute of Metrological Research, (INRIM), to transfer the traceability to high accuracy multifunction electrical instruments used in Secondary calibration laboratories. These two standards are formed respectively by ten in parallel connected 10 Ω and 100 kΩ(More)
This paper describes a measurement circuit for the calibration of pico-ammeters in dc current. The system is based on a 100 MΩ Hamon network developed at INRIM to improve the traceability level of the maintained 1 GΩ standard. Besides the Hamon network, the measurement system, presented in this paper, consists of a precision dc voltage source and an(More)
At the National Institute of Metrological Research (INRIM), a Hamon guarded 10×100 M network was developed to improve the traceability levels of dc resistance at 1 G level. Utilizing and revisiting this project, a Hamon 10×10 G network is developed to extend the capabilities of the Hamon scaling technique up to 100 G . The novelty of the 10× 10 G network is(More)
Recently at National Institute of Metrological Research (INRIM) a Hamon actively guarded 10×100 MΩ was developed to improve the traceability levels at 1 GΩ level. Utilizing and revisiting this project, a Hamon 10×10 GΩ network is now under realization to extend the capabilities of the Hamon method up to 100 GΩ. Moreover, by means of this Hamon network, it(More)
At IEN, a guarded switching system for automatic selection of high value resistors under calibration was developed and metrologically characterized. By means of this system it is possible to select and connect to the measurement system [1, 2] high value resistors in three terminals configuration. As a matter of fact, its guard system allows to reduce the(More)