Fabien Essely

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The evolution of laser sources has led to the advent of new laser-based techniques for failure analysis. The pulsed OBIC (optical beam induced current) technique is one of them, which is based on the photoelectric laser stimulation of the device under test (DUT) at a micrometric scale. The suitability of this technique to localize failure sites resulting(More)
Article history: Received 1 July 2008 Received in revised form 1 July 2008 Available online 12 August 2008 0026-2714/$ see front matter 2008 Elsevier Ltd. A doi:10.1016/j.microrel.2008.07.043 * Corresponding author. Tel.: +33 442 686 852; fax E-mail address: aziz.machouat@st.com (A. Machou Dynamic laser stimulation (DLS) techniques based on operating(More)
Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve(More)
Various optical defect localization techniques are applied on the same integrated circuits (IC). These circuits were previously stressed by Electro Static Discharges (ESD) to create defects. The results obtained by each technique were analyzed to determine the nature of the defects. The different data are compared to assess their sensitivity and to evaluate(More)
The optical IR-OBIRCh technique is a standard failure analysis tool used to localize defects that are located at interconnects layers levels. For a functional logic failure, a failing test pattern is used to condition the device into a particular logic state to generate the failure. Commonly, the defect is detected for a set of test patterns. All test(More)
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