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Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve(More)
The optical IR-OBIRCh technique is a standard failure analysis tool used to localize defects that are located at interconnects layers levels. For a functional logic failure, a failing test pattern is used to condition the device into a particular logic state to generate the failure. Commonly, the defect is detected for a set of test patterns. All test(More)
The evolution of laser sources has led to the advent of new laser-based techniques for failure analysis. The pulsed OBIC (optical beam induced current) technique is one of them, which is based on the photoelectric laser stimulation of the device under test (DUT) at a micrometric scale. The suitability of this technique to localize failure sites resulting(More)
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