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Journals and Conferences
We have investigated swift heavy ion (SHI) induced dewetting  of a 50 nm thin Fe2O3-film on Si utilizing our new in-situ scanning electron microscope (SEM) . Before the experiment, the sample… (More)
A new in situ high resolution electron microscope (HRSEM) setup has been designed and integrated into the materials science beamline (M-branch) of the universal linear accelerator at Gesellschaft für… (More)