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A physical model for trap-assisted inelastic tunnel current through potential barriers in semiconductor structures has been developed. The model is based on the theory of multiphonon transitions between detrapped and trapped states and the only fitting parameters are those of the traps ~energy level and concentration! and the Huang–Rhys factor. Therefore,… (More)

The direct and assisted-by-trap elastic tunnel current in metal–oxide–semiconductor capacitors with ultrathin gate oxide ~1.5–3.6 nm! has been studied. Bardeen’s method has been adapted to obtain the assisted tunnel current, in addition to the direct tunnel current. The dependence of the assisted current on the trap distribution in energy has also been… (More)

- F. Gámiz, P. Cartujo-Cassinello, Juan Bautista Roldan, F. Jiménez-Molinos
- 2002

We show by simulation that electron mobility and velocity overshoot are greater when strained inversion layers are grown on SiGe-On-insulator substrates ~strained Si/SiGe-OI! than when unstrained silicon-on-insulator ~SOI! devices are employed. In addition, mobility in these strained inversion layers is only slightly degraded compared with strained bulk… (More)

- Andreas Gehring, F. Jiménez-Molinos, Hans Kosina, A. Palma, F. Gámiz, Siegfried Selberherr
- Microelectronics Reliability
- 2003

Electron transport in ultrathin double-gate (DG) silicon-on-insulator (SOI) devices is studied as a function of the transverse electric field and the silicon layer thickness, with particular attention to the evaluation of stationary drift velocity and low-field mobility at room temperature. A one-electron Monte Carlo simulator has been used. 2001 Elsevier… (More)

We present an analytical model to describe static and transient trap-assisted inelastic tunneling of electrons through insulating energy barriers. The model was implemented in a device simulator in order to calculate the gate current in metal-oxidesemiconductor capacitors, the trap occupancy in the gate oxides and the charging and discharging… (More)

- Rodrigo Picos, Juan B. Roldán, Mohamed Moner Al Chawa, F. Jiménez-Molinos, E. Garcia-Moreno
- 2016 Conference on Design of Circuits and…
- 2016

One of the main problems in the simulation of systems based on memristors is the intrinsic variability shown by these devices. In this paper we analyzed this variability in resistive switching based memristors by using the charge-flux relations instead of the traditional current-voltage approach. We have used simulated and experimental data to develop a… (More)

- F. Gámiz, P. Cartujo-Cassinello, F. Jiménez-Molinos, J. E. Carceller
- 2003

We study the influence of the image and exchange-correlation effects in double-gate silicon-on-insulator ~DGSOI! devices, in the calculation of both charge distribution and electron mobility. The image and exchange correlation potentials produce a greater confinement of the carriers and, according to the uncertainty principle, a greater phonon scattering… (More)

A new model for the simulation of physical inelastic trap-assisted tunneling has been implemented in the device simulator MINIMOS-NT. It is based on a recently published model for multi-phonon transitions between trapped and detrapped electronic states. We show that the numerical solution of the Schrödinger equation can be approximated by analytical… (More)

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