F J Humphreys

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A method of accurately measuring misorientations by electron backscatter diffraction (EBSD), which is an extension of that proposed by Wilkinson and based on the comparison of diffraction patterns, is described. The method has been applied to linescans, and found to improve the angular resolution by a factor of more than 30. The consequent improvement in(More)
The use of data averaging to improve the angular precision of electron backscattered diffraction (EBSD) maps is discussed. It is shown that orientations may be conveniently and rapidly averaged using the four Euler-symmetric parameters which are coefficients of a quaternion representation. The processing of EBSD data requires the use of an edge preserving(More)
A scanning electron microscope with a thermal field emission gun (FEGSEM) is found to offer significant improvements in electron backscatter diffraction performance over a conventional W-filament scanning microscope. The spatial resolution is improved by a factor of approximately 3 in the FEGSEM and is optimized at probe currents of 50-300 nA and at 10-15(More)
In-situ annealing experiments were performed in the scanning electron microscope on a single-phase Al-0.13Mg alloy cold rolled to different strain levels. Once the validity of the technique had been verified by comparison of the recrystallization kinetics and final grain size with bulk annealed samples, the method was used in combination with electron(More)
Electron backscatter diffraction maps are capable of yielding a substantial amount of quantitative information about grains, subgrains and boundaries, and the amount and quality of the data may be substantially increased if the pixels of the map are re-analysed so as to 'reconstruct' complete grains or subgrains. The paper discusses the various methods of(More)
The effect of hot deformation on fully recrystallized aluminium-copper alloys (Al-4wt%Cu and Al-33wt%Cu) with different volume fractions of CuAl(2) has been studied. The alloys are Zener pinned systems with different superplastic properties. Strain-induced grain growth, observed in both alloys, was quantitatively estimated by means of electron microscopy(More)
The technique of combining in situ hot-deformation and high resolution electron backscattered diffraction (EBSD) has been applied to study the mechanisms operating during the thermomechanical processing of metals. A simple hot tensile-straining stage is installed in a field emission gun scanning electron microscope equipped with an EBSD system and has been(More)
The use of high-resolution electron backscatter diffraction in the scanning electron microscope to quantify the volume fraction of recrystallization and the recrystallization kinetics is discussed. Monitoring the changes of high-angle grain boundary (HAGB) content during annealing is shown to be a reliable method of determining the volume fraction of(More)
Grain boundary engineering of austenitic stainless steel, through the introduction of plastic strain and thermal annealing, can be used to develop microstructures with improved resistance to inter-granular degradation. The influence of low-strain thermo-mechanical processing on grain boundary network development, with systematic variations of annealing(More)
In situ electron backscatter diffraction microstructural analysis of recrystallizing interstitial free steels deformed to strains of 0.75 and 1.6 has been carried out in a FEG-SEM. The experimental procedures are discussed, and it is shown that there is no degradation of the electron backscatter diffraction patterns at temperatures up to 800 degrees C.(More)