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As the areal density of magnetic recording increases well beyond 100 Gb/in<sup>2</sup>, the critical dimensions of recording heads continue to shrink at a rate of 15%-30% per year. Read sensors with 100 nm physical read widths are being routinely fabricated using undercut resist images and solvent-based liftoff processes. However, because standard liftoff(More)
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO₂) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553)(More)
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