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Journals and Conferences
A major contributor to reliability failures in integrated circuits has been the failure of dielectrics under operating stress. This paper summarizes extensive studies carried out on many… (More)
A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.
A study of screening effect on MSOS dots has shown the effect of time as well as stress on the screening of time-dependent breakdown. A model is described which is based on a reduction of allotted… (More)