Eugene Normand

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This paper reports 14 MeV neutron induced single-event effects results for a variety of microelectronic devices that include an ADC, operational amplifiers, optocoupler, flash memory, PowerPC microprocessor, SRAM, and SDRAM. Data were collected to evaluate these devices for possible use in NASA spacecraft.
  • Eugene Normand
  • Advances in space research : the official journal…
  • 1994
The proton telescope aboard the GOES-7 satellite continuously records the proton flux at geosynchronous orbit, and therefore provides a direct measurement of the energetic protons arriving during solar energetic particle (SEP) events. Microelectronic devices are susceptible to single event upset (SEU) caused by both energetic protons and galactic cosmic ray(More)
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