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We present a non-invasive method for recognition of components in a digital CMOS integrated circuit (IC). We use a confocal infrared laser scanning optical microscope to collect multimodal images through the backside of the IC. Individual modes correspond to passive reflectivity measurements or active measurements, such as light-induced voltage alteration.(More)
The need to detect and localize activity exists in a variety of fields and has broad applications ranging from brain activity for neuroscience to image/video change detection for scene surveillance. In this paper, we introduce a method for localizing activity in integrated circuits (IC) using a laser scanning microscope. Specifically, we develop an activity(More)
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