Engin Afacan

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—Failure due to aging mechanisms is an important concern for RF circuits. In-field aging results in continuous degradation of circuit performances before they cause catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device(More)
—The design of complex analog circuits by using flat optimization-based approaches is inefficient, even impossible, due to the high number of design variables and the growth of the cost of performance evaluation with the circuit size. Over the past two decades, top-down hierarchical design approaches have been developed and applied. They are based on(More)
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