Engin Afacan

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—This paper proposes an efficient Quasi-Monte Carlo based yield aware analog circuit synthesis tool with an adaptive sampling mechanism. Monte Carlo (MC) analysis is commonly preferred to estimate process variation effects on the yield of manufactured ICs. However, conventional MC requires a large number of simulations for accurate estimation. This(More)
—Failure due to aging mechanisms is an important concern for RF circuits. In-field aging results in continuous degradation of circuit performances before they cause catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device(More)