Elbert Bechthum

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
— This paper presents a new foreground DAC calibration method that is insensitive to temperature fluctuations and on-chip disturbances. In the proposed current cell, the same number of unit transistors is always used, guaranteeing matched response for all current cells. These transistors are divided in two groups: a fixed group and a configurable group. The(More)
— The switching characteristics of Digital to Analog Converter (DAC) unit elements can limit DAC dynamic performance at high speeds [1]. Unbalances and mismatches in clock, data and output networks create a non-identical environment for every current cell. Together with mismatch in current cell switching transistors and other non-idealities, this causes the(More)
  • 1