Elbert Bechthum

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— The switching characteristics of Digital to Analog Converter (DAC) unit elements can limit DAC dynamic performance at high speeds [1]. Unbalances and mismatches in clock, data and output networks create a non-identical environment for every current cell. Together with mismatch in current cell switching transistors and other non-idealities, this causes the(More)
— This paper presents a new foreground DAC calibration method that is insensitive to temperature fluctuations and on-chip disturbances. In the proposed current cell, the same number of unit transistors is always used, guaranteeing matched response for all current cells. These transistors are divided in two groups: a fixed group and a configurable group. The(More)
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