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We present a novel RF identification transponder based on nonlinear transmission lines (NLTLs). The NLTLs provide an effective solution to self-jamming with the harmonic generation property, and they are passive, compact, and offer easy impedance. Three NLTLs are fabricated with a different Bragg cutoff frequency <i>fT</i> in an IBM 8RF 0.13-&#x03BC; m CMOS(More)
Millimeter-precision meter-distance real-time indoor ranging capability is challenging due to multipath reflections in a rich scattering environment. Traditional continuous wave (CW) phase-based ranging methods, although simple and flexible, are vulnerable to phase offsets and interferences. We improve the previous CW approach by passive broadband harmonic(More)
We propose and demonstrate accurate 3D real-time indoor localization via broadband nonlinear backscatter in passive devices. The proposed method does not need any relative motion between a reader and a tag or the use of reference anchor nodes. In the conventional radio frequency identification (RFID) system, a passive tag responds to a reader by switching(More)
We propose the nonlinear transmission line (NLTL) as an effective global interconnect method that offers capabilities of rise/fall edge sharpening, signal shaping/amplification, and impedance matching. Interconnect line characteristics of NLTLs implemented with the MIT Lincoln Lab 0.18/spl mu/m FDSOI (fully-depleted silicon-on-insulator) CMOS process are(More)
We report efficient crosstalk and signal reflection reduction with nonlinear transmission lines (NLTLs) for high-speed VLSI. Crosstalk measurements of NLTLs implemented with the Lincoln Lab 0.18mum FDSOI (fully-depleted silicon-on-insulator) CMOS process are performed in time domain as well as by S-parameters up to 25GHz. The excellent suppression(More)
To accurately simulate modern semiconductor process steps, TCAD tools must include a variety of physical models and numerical methods. Increasingly complex physical formulations are required to account for eeects that were not important in previous generation of technology. As a speciic example, the impurity diiusion mechanisms owing to point defects and(More)
Implementation and validation of 2D and 3D etching and deposition simulators using a general TCAD geometry server with both the boundary and level-set representation is performed. Advantages of our approach include not only enhanced functionalities such as accurate and robust boundary movement and smoothing, but also well-defined procedural interface for(More)