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Podocyte apoptosis induced by hyperglycemia is considered a critical factor in the development of diabetic nephropathy. Recent studies have implicated Notch signaling in podocyte apoptosis; however, its regulatory mechanisms are not fully understood. In this study, we found that high-glucose treatment increased Notch1 and Jagged-1 expression, the(More)
This study developed a Smartphone Addiction Proneness Scale (SAPS) based on the existing internet and cellular phone addiction scales. For the development of this scale, 29 items (1.5 times the final number of items) were initially selected as preliminary items, based on the previous studies on internet/phone addiction as well as the clinical experience of(More)
Nowadays, the semiconductor manufacturing becomes very complex, consisting of hundreds of individual processes. If a faulty wafer is produced in an early stage but detected at the last moment, unnecessary resource consumption is unavoidable. Measuring every wafer’s quality after each process can save resources, but it is unrealistic and impractical because(More)
With recent advance in wireless networks and advent of powerful mobile devices such as smart phones, IPTV services become feasible in mobile platforms. Peer-toPeer streaming techniques are expected be a promising solution to a large-scale mobile IPTV services by providing low cost and high scalability. On the other hand, the major concern for designing(More)
Response modeling, which predicts whether each customer will respond or how much each customer will spend based on the database of customers, becomes a key factor of direct marketing. In previous researches, several classification approaches, include Support Vector Machines (SVM) and Neural Networks (NN), have been applied for response modeling. However,(More)
The purpose of virtual metrology (VM) in semiconductor manufacturing is to support process monitoring and quality control by predicting the metrological values of every wafer without an actual metrology process, based on process sensor data collected during the operation. Most VM-based quality control schemes assume that the VM predictions are always(More)