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Reliability is a major economic and technical challenge for power electronics. This paper aims at exploring the impact of reconstruction of source metallization  due to ageing on temperature and mechanical strain distributions within a smart power device. Based on 3D FEM electro-thermal simulations, we explore thermal and mechanical impact of source… (More)
This paper presents a methodology, based on 3D electro-thermal simulation, to investigate failures of vertical power MOSFET due to metallization aging of source terminal. The numerical results were correlated with experiment based on past study.
Very little is known about the vowel systems of phonologically disordered children. This study provides longitudinal data regarding vowel use of identical twin boys between the ages of 3;5 and 4;9. The boys were identified as phonologically disordered; however, their parents chose not to enroll them in therapy. Vowel-use information was taken from… (More)