Dmitriy Zanin

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Recent experiments report the current (I) versus voltage (V) characteristics of a tunnel junction consisting of a metallic tip placed at a distance d from a planar electrode, d varying over six orders of magnitude, from few nanometres to few millimetres. In the 'electric-field-assisted' (or 'field emission') regime, as opposed to the direct tunnelling(More)
The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology [1]. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface(More)
The paramagnetic-to-ferromagnetic phase transition is classified as a critical phenomenon due to the power-law behaviour shown by thermodynamic observables when the Curie point is approached. Here we report the observation of such a behaviour over extraordinarily many decades of suitable scaling variables in ultrathin Fe films, for certain ranges of(More)
invariance in the absence of a critical point N. Saratz, D.A. Zanin, U. Ramsperger, S.A. Cannas, D. Pescia & A. Vindigni Nature Communications 7:13611 doi: 10.1038/ncomms13611 (2016); Published 5 Dec 2016; Updated 17 Jan 2017 The original version of this Article contained a typographical error in the spelling of the author S.A. Cannas, which was incorrectly(More)
We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target-the scanning field-emission microscopy regime (SFM). In the SFM mode, a secondary-electron contrast as high as 30% is observed when imaging a monoatomic step between a clean W(110)- and an(More)
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