Didier Tonneau

  • Citations Per Year
Learn More
Scanning probe microscopes are now widely used in the field of material science and engineering for surface imaging at atomic scale. Their principle is based on the surface probing by a sharp tip approached at a nanometric distance of the surface. The probe is fixed to piezoelectric actuators allowing its displacement above the surface. An electronic(More)
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect(More)
We show that nano-optical antennas are capable of controlling the luminescence induced by the absorption of x rays into matter. The x-ray-excited luminescence from a tiny scintillation cluster coupled to a horn nano-optical antenna is highly directed and determined by the antenna's geometrical parameters. Directionality is sufficiently high to efficiently(More)
XRF (X-ray fluorescence) is a powerful technique for elemental analysis with a high sensitivity. The resolution is presently limited by the size of the primary excitation X-ray beam. A test-bed for confocal-type XRF has been developed to estimate the ultimate lateral resolution which could be reached in chemical mapping using this technique. A polycapillary(More)
Tungsten and nickel carbonyls were used to produce metal microstructures by laser-induced chemical vapor deposition (CVD) on various substrates. The deposition rate of microstructures produced by thermodecomposition of W(CO)6 on Si substrates heated with a cw Ar+ laser beam was relatively low (10 to 30 nm/s) even at high temperatures (above 900°C). Ni(More)
  • 1