Diana Bodean

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This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
This paper presents the technique and tools for automatization of the synthesis of constrained-random test-bench for verification of the synthesizable designs of microprocessors and microcontrollers. The structure and parameters of constrained-random test-bench is coded by a stochastic grammar that is specified by elaborated tools. The Application, called(More)
Scan and ring schemes of the pseudo-ring memory selftesting are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic(More)
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