Dhiraj Goswami

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In order to generate correct at-speed scan patterns, the effect of timing exceptions and constraints needs to be considered during test generation. A path-oriented approach to handle timing exception paths during at-speed ATPG has been presented in [1][2]. The new method has been applied to and tested on many example circuits at Semiconductor Technology(More)
Generating test patterns without considering timing exceptions and constraints can lead to invalid test responses, resulting in false failures on the tester or yield loss. A path-oriented approach to handle timing exception paths with setup violations during at-speed test generation has been presented in [1]. This paper presents a unified and complete(More)
Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern electronic designs. The high clock speeds and small geometry sizes found in today's integrated circuits have led to an increase of speed-related defects. Fortunately,(More)
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