Dennis Crippa

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A novel On-chip delay measure presented which is suitable for wide applicatio chip measurements, monitoring and process co circuit is based upon multiple characterization u ring oscillator, latches and counter. The delay oscillator defines the measurement reso characterization unit. Each characterization u delay cell with delay varying by few Pico-s(More)
Following the will to answer to the energy constrained applications requirements, an Ultra-Low Voltage (ULV) 40nm Bose-Chaudhuri-Hocquenghem (BCH) error-correcting circuit is presented. Mapped on a ULV specific standard cells library, the circuit was designed following standard industrial implementation and verification flows. The BCH circuit runs at(More)
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