Davide Dicorato

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Digitali ntegrated circuitsf abricated in nano-technologies have firsts hown to be more vulnerableto transiente rrors effectst han their predecessors. But they also show effects of stress-induced defectsr esulting in earlyl ife-time failures. In general, power dissipation problems and dielectrics tress, due to high field strength, aret he main reasons for(More)
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