David Y. Lepejian

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Thanks to the swift advance of semiconductor technology companies continually do introduce new embedded functions in their integrated circuits. Embedded support functions, such as for Design-for-Testability, have already become traditional. Today, advanced embedded functions, beyond DFT, are being introduced into new designs to enhance the overall(More)
This paper presents an iterative maximum likelihood (ML) estimation method for statistical analysis of yield loss. By means of Inductive Fault Analysis (IFA) and circuit simulation, the map between defects and corresponding fault behaviors can be constructed for process-monitor SRAMs. Using the data from a tester describing the number of times each fault(More)
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