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Abstract. We consider a simple random walk on a discrete torus (Z/NZ) with dimension d ≥ 3 and large side length N . For a fixed constant u ≥ 0, we study the percolative properties of the vacant set,… (More)

We consider a Poisson point process on the space of lines in $${{\mathbb R}^d}$$, where a multiplicative factor u > 0 of the intensity measure determines the density of lines. Each line in the… (More)

- James R. Brockmole, David Z. Hambrick, David Windisch, John M. Henderson
- Quarterly journal of experimental psychology
- 2008

In contextual cueing, the position of a search target is learned over repeated exposures to a visual display. The strength of this effect varies across stimulus types. For example, real-world scene… (More)

Precise lattice spacing measurements are carried out with an X-ray double-source, double-crystal transmission technique in order to investigate the lattice distortions in silicon crystals containing… (More)

- David Windisch
- 2008

We investigate the relation between the local picture left by the trajectory of a simple random walk on the torus (Z/NZ), d ≥ 3, until uN time steps, u > 0, and the model of random interlacements… (More)

Abstract X-ray double-crystal diffractometry has been used to investigate the lattice distortions in silicon crystals containing carbon impurities. Precise lattice-spacing measurements have been… (More)

- David Windisch
- Neural Computation
- 2005

The question of whether it is possible to load deep neural network architectures efficiently is examined by considering the class of pyramidal architectures. This class allows only a low interaction… (More)

- David Windisch
- 2010

We study the entropy of the distribution of the set Rn of vertices visited by a simple random walk on a graph with bounded degrees in its first n steps. It is shown that this quantity grows linearly… (More)

In this paper, we examine the relation between managerial discretion in accruals and informational efficiency. We measure managerial discretion in accruals by the absolute value of abnormal accruals.… (More)