David Trémouilles

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This paper presents an experimental comparison of laser beam based techniques applied to a case study concerning ESD defect location. Thermal laser stimulation and non-biased optical beam induced current techniques are evaluated and discussed. Experimental results demonstrate the advantages and weak points of the two approaches. 2003 Elsevier Science Ltd.(More)
This paper presents the results of a study on issues of reliability and accelerated life testing for radio frequency micro-electromechanical system (RF-MEMS) capacitive devices. A human-body-model electrostatic discharge tester has been used to induce charging by operating at stress levels much higher than would be expected in normal use. Temperature ranges(More)
This paper addresses the ESD reliability issues in RFICs, focusing on the technology impact on the device and design. We also present the basic RF ESD protection methods used in industry. Presents the general topology of a 5 GHz LNA, which is protected using several ESD protection methodologies, and describes the 90 nm CMOS process technology used for the(More)
This paper addresses an innovative solution to develop a circuit to perform accelerated stress tests of capacitive MEMS switches and shows the use of instruments and equipment to monitor physical aging phenomena. A dedicated test circuit was designed and fabricated in order to meet the need for accelerated techniques for those structures. It integrated an(More)
The number of circuit design iterations due to electrostatic discharge (ESD) failures increases with the complexity of VLSI technologies and their shrinking. In this paper, we show how TCAD and ESD SPICE modeling can be used to solve ESD protection issues in an analog CMOS technology. 2002 Elsevier Science Ltd. All rights reserved.