David J. Perello

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Grain boundaries in monolayer transition metal dichalcogenides have unique atomic defect structures and band dispersion relations that depend on the inter-domain misorientation angle. Here, we explore misorientation angle-dependent electrical transport at grain boundaries in monolayer MoS2 by correlating the atomic defect structures of measured devices(More)
In Fig. 3 of this article, there are a number of errors in the colours used for the data points and curves. In Fig. 3b, the blue data should be green, referring to a thickness of '3.5 nm', and the green data should be blue, referring to a thickness of '8 nm'. In Fig. 3d, the blue data should be green and refer to a thickness of '3.5 nm', the green data(More)
Recent work has demonstrated excellent p-type field-effect switching in exfoliated black phosphorus, but type control has remained elusive. Here, we report unipolar n-type black phosphorus transistors with switching polarity control via contact-metal engineering and flake thickness, combined with oxygen and moisture-free fabrication. With aluminium contacts(More)
  • 1