David El-Baze

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As security constraints are becoming more and more important, even for low-cost and low-power devices, new attacks and countermeasures are constantly proposed. Following this trend, Body Bias Injection (BBI) was introduced a few years ago. This new fault injection method consists in applying a high voltage pulse on the circuit substrate to induce faults.(More)
ElectroMagnetic Pulse Injection (EMPI) has recently been demonstrated to be an efficient fault injection technique with many advantages especially when considering security issues of Systems on Chip (SoC) embedded on ball grid array packages, i.e. when adversaries do not have an easy access to the backside. EMPI must therefore be considered as a real threat(More)
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